CASI Vision Technology (Luoyang) Co., Ltd.
Semiconductor Detection-Wafer Defect Detection Equipment
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Product Introduction

Patternless wafer defect detection is the latest system developed by Zhongke Huiyuan Vision Technology Co., Ltd. With sub micron resolution, it can detect the polishing trace, crystal pits, bulges, voids, or other defects that damage the electrical integrity of the transistor.

Product Features

Advantage 1

High resolution, large field of view compatibility, sub micron level defect recognition in tens of millimeter level field of view

Advantage 2

Defects can be displayed in real time and intuitively, which makes it easier to master the overall shape and position of defects

Advantage 3

It is flexible and adaptable, and can customize the automatic detection function according to the demand

Advantage 4

Small, easy to use, easy to install and maintain, easy to operate

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National Service Phone:
0379-6069 6116
Email:hy@casivision.com
Fax:0379 - 60696117
Address:Building 5, Bishengyuan, National University Science Park, No.2 Penglai Road, Jianxi District, Luoyang City, Henan Province
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